Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Miguel Águeda Velasco

2PUBLICATIONS

17CO-AUTHORS

Nonlinear optics and spectroscopyQuantum information, computation and communication

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Mar 16, 2026

Scanning Tunneling Microscopy in high vectorial magnetic fields.

Jaime Rumeu Ozores, Miguel Águeda Velasco, Edwin Herrera

|Jul 02, 2025

The feedback driven atomic scale Josephson microscope.

Samuel D Escribano, Víctor Barrena, David Perconte

Pageof 1

Frequent Collaborators

2 joint publications

Jose Antonio Moreno

2 joint publications

Edwin Herrera

2 joint publications

Isabel Guillamón

2 joint publications

Hermann Suderow

1 joint publications

Samuel D Escribano

1 joint publications

David Perconte

1 joint publications

Jose Gabriel Rodrigo

1 joint publications

Elsa Prada

1 joint publications

Alfredo Levy Yeyati

1 joint publications

Jaime Rumeu Ozores

Frequent Collaborators

2 joint publications

Jose Antonio Moreno

2 joint publications

Edwin Herrera

2 joint publications

Isabel Guillamón

2 joint publications

Hermann Suderow

Top Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on : Jan 19, 2018

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

See more related videos

Top Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on : Jan 19, 2018

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

See more related videos