Jérôme Creuze

2PUBLICATIONS
10CO-AUTHORS
Nanoscale characterisationElemental semiconductors
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Publications (2)

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|Sep 08, 2026
Unveiling and quantifying the topology-dependent premelting of nanoparticles.

|Jan 12, 2024
Quantification of Crystalline Phases in Hf0.5Zr0.5O2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations.

Rebecca Cervasio, Emilie Amzallag, Marine Verseils

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