Saptarshi Ghosh

1PUBLICATIONS
6CO-AUTHORS
Nanoscale characterisation
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Publications (1)

|May 08, 2023
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry.

Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran

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Frequent Collaborators

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Ralfy Kenaz

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Pradheesh Ramachandran

1 joint publications

Kenji Watanabe

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Takashi Taniguchi