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Alessandro Meli, Annamaria Muoio, Riccardo Reitano
Alessandro Meli, Annamaria Muoio, Antonio Trotta

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on : Apr 18, 2019

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on : Jul 17, 2020