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K Churnetski, K M Woo, W Theobald+14
K Churnetski, K M Woo, W Theobald+10
K Churnetski
W Theobald
V Gopalaswamy
S T Ivancic
C Stoeckl
S P Regan
I V Igumenshchev
L Ceurvorst
C J Forrest
P V Heuer
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on : Aug 25, 2016