Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Benjamin A Bircher

1PUBLICATIONS

1CO-AUTHORS

Nonlinear optics and spectroscopy

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Dec 15, 2019

Low-Cost 2D Index and Straightness Measurement System Based on a CMOS Image Sensor.

Alain Küng, Benjamin A Bircher, Felix Meli

Pageof 1

Frequent Collaborators

1 joint publications

Felix Meli

Frequent Collaborators

1 joint publications

Felix Meli

Top Related Videos

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on : Jul 05, 2016

See more related videos

Top Related Videos

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on : Jul 05, 2016

See more related videos