Kazunari Kurita
3PUBLICATIONS
7CO-AUTHORS

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Publications (3)
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|Nov 11, 2022
Reduction of White Spot Defects in CMOS Image Sensors Fabricated Using Epitaxial Silicon Wafer with Proximity Gettering Sinks by CH2P Molecular Ion Implantation.Takeshi Kadono, Ryo Hirose, Ayumi Onaka-Masada
|Nov 24, 2020
Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers.Ayumi Onaka-Masada, Takeshi Kadono, Ryosuke Okuyama
|May 08, 2019
Proximity Gettering Design of Hydrocarbon⁻Molecular⁻Ion⁻Implanted Silicon Wafers Using Dark Current Spectroscopy for CMOS Image Sensors.Kazunari Kurita, Takeshi Kadono, Satoshi Shigematsu
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