Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Youngbin Yoon

1PUBLICATIONS

2CO-AUTHORS

Elemental semiconductors

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Sep 14, 2024

Impact of Channel Thickness and Doping Concentration for Normally-Off Operation in Sn-Doped <i>β</i>-Ga<sub>2</sub>O<sub>3</sub> Phototransistors.

Youngbin Yoon, Yongki Kim, Myunghun Shin

Pageof 1

Frequent Collaborators

1 joint publications

Yongki Kim

1 joint publications

Myunghun Shin

Frequent Collaborators

1 joint publications

Yongki Kim

1 joint publications

Myunghun Shin

Top Related Videos

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

Published on : May 24, 2020

See more related videos

Top Related Videos

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

Published on : May 24, 2020

See more related videos