David Wahlqvist

2PUBLICATIONS
5CO-AUTHORS
Forensic evaluation, inference and statisticsElemental semiconductors
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Publications (2)

|Nov 14, 2024
Model-Fitting Weighted Least Squares as an Alternative to Principal Component Analysis for Analyzing Energy-Dispersive X-ray Spectroscopy Spectrum Images.

David Wahlqvist, Martin Ek

|Jun 06, 2022
Compositional analysis of oxide-embedded III-V nanostructures.

Martin Ek, C Leon M Petersson, Jesper Wallentin

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