J C Woicik
2PUBLICATIONS
10CO-AUTHORS

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Publications (2)
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|Dec 02, 2025
Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy.F Capocasa, A K Rumaiz, C Weiland
|Aug 31, 2022
Revisiting the K-edge X-ray absorption fine structure of Si, Ge-Si alloys, and the isoelectronic series: CuBr, ZnSe, GaAs, and Ge.E L Shirley, J C Woicik
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