Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Alain Bravaix

1PUBLICATIONS

0CO-AUTHORS

Electrical energy storage

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Feb 24, 2024

Hot-Carrier Damage in N-Channel EDMOS Used in Single Photon Avalanche Diode Cell through Quasi-Static Modeling.

Alain Bravaix, Hugo Pitard, Xavier Federspiel

Pageof 1

Frequent Collaborators

Frequent Collaborators

Top Related Videos

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on : Apr 18, 2019

See more related videos

Top Related Videos

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on : Apr 18, 2019

See more related videos