Vladimir P Markevich
2PUBLICATIONS
4CO-AUTHORS

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Publications (2)
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|Jan 26, 2021
On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon.Saman Jafari, Yan Zhu, Fiacre Rougieux
|Mar 18, 2020
Characterisation of negative-Udefects in semiconductors.José Coutinho, Vladimir P Markevich, Anthony R Peaker
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