Masanobu Yoshikawa

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0CO-AUTHORS
Numerical modelling and mechanical characterisation
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Publications (1)

|Jun 21, 2019
Stress Characterization of the Interface Between Thermal Oxide and the 4H-SiC Epitaxial Layer Using Near-Field Optical Raman Microscopy.

Masanobu Yoshikawa, Yasuhiko Fujita, Masataka Murakami

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