Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Hugh Simons

10PUBLICATIONS

38CO-AUTHORS

Elemental semiconductorsInstruments and techniquesPhotonics, optoelectronics and optical communicationsStructure and dynamics of materialsCeramics

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (10)

Sort by Publication Date:

|Jun 19, 2023

Electric-field-induced non-ergodic relaxor to ferroelectric transition in BiFeO<sub>3</sub>-<i>x</i>SrTiO<sub>3</sub> ceramics.

Leonardo Oliveira, Jeppe Ormstrup, Marta Majkut

|Jul 05, 2022

An automated approach to the alignment of compound refractive lenses.

Sean Breckling, Bernard Kozioziemski, Leora Dresselhaus-Marais

|Mar 15, 2022

Unveiling the Interaction Mechanisms of Electron and X-ray Radiation with Halide Perovskite Semiconductors using Scanning Nanoprobe Diffraction.

Jordi Ferrer Orri, Tiarnan A S Doherty, Duncan Johnstone

|Jul 15, 2021

In situ visualization of long-range defect interactions at the edge of melting.

Leora E Dresselhaus-Marais, Grethe Winther, Marylesa Howard

|Nov 10, 2020

Conceptual Framework for Dislocation-Modified Conductivity in Oxide Ceramics Deconvoluting Mesoscopic Structure, Core, and Space Charge Exemplified for SrTiO<sub>3</sub>.

Lukas Porz, Till Frömling, Atsutomo Nakamura

|Jul 03, 2020

Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes.

Chunguang Chen, Tao Zhou, Dmitri L Danilov

Pageof 2

Frequent Collaborators

3 joint publications

Carsten Detlefs

2 joint publications

Leora E Dresselhaus-Marais

1 joint publications

Anders Filsøe Pedersen

1 joint publications

Henning Friis Poulsen

1 joint publications

Astri Bjørnetun Haugen

1 joint publications

Søren Schmidt

1 joint publications

Dragan Damjanovic

1 joint publications

Ying-Hao Chu

1 joint publications

Nagarajan Valanoor

1 joint publications

Chunguang Chen

Frequent Collaborators

3 joint publications

Carsten Detlefs

2 joint publications

Leora E Dresselhaus-Marais

1 joint publications

Anders Filsøe Pedersen

1 joint publications

Henning Friis Poulsen

Top Related Videos

Chemical Synthesis of Porous Barium Titanate Thin Film and Thermal Stabilization of Ferroelectric Phase by Porosity-Induced Strain

Chemical Synthesis of Porous Barium Titanate Thin Film and Thermal Stabilization of Ferroelectric Phase by Porosity-Induced Strain

Published on : Mar 27, 2018

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Published on : Jun 06, 2017

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

See more related videos

Top Related Videos

Chemical Synthesis of Porous Barium Titanate Thin Film and Thermal Stabilization of Ferroelectric Phase by Porosity-Induced Strain

Chemical Synthesis of Porous Barium Titanate Thin Film and Thermal Stabilization of Ferroelectric Phase by Porosity-Induced Strain

Published on : Mar 27, 2018

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Published on : Jun 06, 2017

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

See more related videos