Néstor Eduardo Sánchez-Arriaga

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0CO-AUTHORS
Microelectronics
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Publications (1)

|Jun 10, 2023
A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing.

Néstor Eduardo Sánchez-Arriaga, Divya Tiwari, Windo Hutabarat

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