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Sergei Egorov, Timo Schudeleit, Konrad Wegener
Jodok Weixler, Marc Zweifel, Timo Schudeleit

Production of Single Tracks of Ti-6Al-4V by Directed Energy Deposition to Determine the Layer Thickness for Multilayer Deposition
Published on : Mar 13, 2018

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
Published on : Feb 27, 2013