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Nzar Luqman Muttalib, Botan Jawdat Abdullah
Nzar Rauf Abdullah, Botan Jawdat Abdullah, Rangeen Othman Salih+2
Vidar Gudmundsson
Nzar Luqman Muttalib
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016
Atomically Defined Templates for Epitaxial Growth of Complex Oxide Thin Films
Published on : Dec 04, 2014