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Matthias Häußler, Robin Terhaar, Martin A Wolff+11
Robin Terhaar
Martin A Wolff
Helge Gehring
Fabian Beutel
Wladick Hartmann
Michael Wahl
Wolfram H P Pernice
Carsten Schuck
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on : Apr 01, 2020