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Shotaro Takeuchi

1PUBLICATIONS

1CO-AUTHORS

Elemental semiconductors

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Publications (1)

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|Mar 30, 2017

Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction.

Kazuki Shida, Shotaro Takeuchi, Yasuhiko Imai

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Shigeru Kimura

Frequent Collaborators

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Shigeru Kimura

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