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Der-Hsien Lien, Matin Amani, Sujay B Desai+6
Der-Hsien Lien
Matin Amani
Sujay B Desai
Geun Ho Ahn
Jr-Hau He
Joel W Ager
Ming C Wu
Ali Javey
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016