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Timothy Long

2PUBLICATIONS

10CO-AUTHORS

Functional materialsElemental semiconductors

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Publications (2)

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|Jun 24, 2026

Automated laboratory x-ray diffractometer and fluorescence spectrometer for high-throughput materials characterization.

|Nov 22, 2023

High-throughput determination of grain size distributions by EBSD with low-discrepancy sampling.

Timothy J H Long, William Holbrook, Todd C Hufnagel

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Frequent Collaborators

2 joint publications

Todd C Hufnagel

1 joint publications

Tim Mueller

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Hyun Sang Park

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Alexander deJong

1 joint publications

Ali Rachidi

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Kacper Kowalik

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Gannon Murray

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Rohit Berlia

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David Elbert

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Timothy P Weihs

Frequent Collaborators

2 joint publications

Todd C Hufnagel

1 joint publications

Tim Mueller

1 joint publications

Hyun Sang Park

1 joint publications

Alexander deJong