Deying Xia

2PUBLICATIONS
5CO-AUTHORS
Instruments and techniquesElectrical circuits and systems
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Publications (2)

|Aug 16, 2023
Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach.

Frances I Allen, Paul T Blanchard, Russell Lake

|Jan 16, 2019
Defect Localization and Nanofabrication for Conductive Structures with Voltage Contrast in Helium Ion Microscopy.

Deying Xia, Shawn McVey, Chuong Huynh

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