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Shihao Tang

1PUBLICATIONS

5CO-AUTHORS

Electronic device and system performance evaluation, testing and simulation

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Publications (1)

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|Dec 19, 2020

Using Deep Learning to Detect Defects in Manufacturing: A Comprehensive Survey and Current Challenges.

Jing Yang, Shaobo Li, Zheng Wang

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Jing Yang

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Shaobo Li

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Zheng Wang

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Hao Dong

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Jun Wang

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Jing Yang

1 joint publications

Shaobo Li

1 joint publications

Zheng Wang

1 joint publications

Hao Dong

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