Myeongsu Chae

1PUBLICATIONS
1CO-AUTHORS
Electronic device and system performance evaluation, testing and simulation
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Publications (1)

|May 27, 2023
Investigation of the Gate Degradation Induced by Forward Gate Voltage Stress in p-GaN Gate High Electron Mobility Transistors.

Myeongsu Chae, Hyungtak Kim

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Frequent Collaborators

1 joint publications

Hyungtak Kim