Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Yu-Min Liu

1PUBLICATIONS
8CO-AUTHORS
Elemental semiconductors
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

Sort by Publication Date:
|Mar 12, 2020
Molecular defect-containing bilayer graphene exhibiting brightened luminescence.

Xin-Jing Zhao, Hao Hou, Peng-Peng Ding

Pageof 1

Frequent Collaborators

1 joint publications

Xin-Jing Zhao

1 joint publications

Hao Hou

1 joint publications

Peng-Peng Ding

1 joint publications

Ze-Ying Deng

1 joint publications

Yang-Yang Ju

1 joint publications

Shun-He Liu

1 joint publications

Chun Tang

1 joint publications

Yuan-Zhi Tan

Frequent Collaborators

1 joint publications

Xin-Jing Zhao

1 joint publications

Hao Hou

1 joint publications

Peng-Peng Ding

1 joint publications

Ze-Ying Deng

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.3K
See more related videos

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.3K
See more related videos