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J Watson, I Olcina, J Soria+8
J Watson
I Olcina
J Soria
S Kravitz
E E Deck
E P Bernard
L Tvrznikova
W L Waldron
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015