Young-Joo Kim
2PUBLICATIONS
1CO-AUTHORS
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Publications (2)
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|Dec 22, 2025
AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry.Juwon Jung, Leeju Hwang, Nagyeong Kim
|Feb 20, 2025
Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants.Juwon Jung, Nagyeong Kim, Kibaek Kim
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