Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Daniel Hothem

1PUBLICATIONS
3CO-AUTHORS
Quantum information, computation and communication
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

Sort by Publication Date:
|Jul 02, 2025
Measuring error rates of mid-circuit measurements.

Daniel Hothem, Jordan Hines, Charles Baldwin

Pageof 1

Frequent Collaborators

1 joint publications

Charles Baldwin

1 joint publications

Robin Blume-Kohout

1 joint publications

Timothy Proctor

Frequent Collaborators

1 joint publications

Charles Baldwin

1 joint publications

Robin Blume-Kohout

1 joint publications

Timothy Proctor

Top Related Videos

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on : Apr 18, 2019

32.1K
See more related videos

Top Related Videos

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on : Apr 18, 2019

32.1K
See more related videos