Md Mamunur Rahman
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1CO-AUTHORS
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Publications (4)
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|Dec 23, 2020
Characterization of Electrical Traps Formed in Al2O3 under Various ALD Conditions.Md Mamunur Rahman, Ki-Yong Shin, Tae-Woo Kim
|Mar 19, 2020
Border Trap Characterizations of Al2O3/ZrO2 and Al2O3/HfO2 Bilayer Films Based on Ambient Post Metal Annealing and Constant Voltage Stress.Md Mamunur Rahman, Dae-Hyun Kim, Tae-Woo Kim
|Jul 10, 2019
Border Trap Extraction with Capacitance- Equivalent Thickness to Reflect the Quantum Mechanical Effect on Atomic Layer Deposition High-k/In0.53Ga0.47As on 300-mm Si Substrate.Md Mamunur Rahman, Jun-Gyu Kim, Dae-Hyun Kim
|Jun 02, 2019
Characterization of Al Incorporation into HfO2 Dielectric by Atomic Layer Deposition.Md Mamunur Rahman, Jun-Gyu Kim, Dae-Hyun Kim
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