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Peng Xia

1PUBLICATIONS

4CO-AUTHORS

Compound semiconductors

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Publications (1)

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|Oct 21, 2021

Point defect detection and strain mapping in Si single crystal by two-dimensional multiplication moiré method.

Qinghua Wang, Shien Ri, Peng Xia

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Frequent Collaborators

1 joint publications

Qinghua Wang

1 joint publications

Shien Ri

1 joint publications

Jiaxing Ye

1 joint publications

Nobuyuki Toyama

Frequent Collaborators

1 joint publications

Qinghua Wang

1 joint publications

Shien Ri

1 joint publications

Jiaxing Ye

1 joint publications

Nobuyuki Toyama

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