Jérôme Richy

1PUBLICATIONS
2CO-AUTHORS
Microelectronics
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Publications (1)

|Apr 17, 2024
Strained Silicon Technology: Non-Destructive High-Lateral-Resolution Characterization Through Tip-Enhanced Raman Spectroscopy.

Giancarlo La Penna, Chiara Mancini, Anacleto Proietti

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