Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Muhammad Siyar

2PUBLICATIONS

5CO-AUTHORS

Elemental semiconductorsPyrometallurgy

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Dec 11, 2025

High-performance electronic, optical, and thermoelectric properties of 2D Mg<sub>2</sub>In<sub>2</sub>S<sub>5</sub> monolayer for energy applications.

Zahid Ullah, Rajwali Khan, Muhammad Amir Khan

|Sep 08, 2025

Transforming Waste to Innovation: Sustainable Piezoelectric Properties of Pb(Ti <sub><b>0.52</b></sub> Zr <sub><b>0.48</b></sub> )O <sub><b>3</b></sub> with Recycled β‑PbO Massicot.

Amna Idrees, Gwangseop Lee, Hamid Jabbar

Pageof 1

Frequent Collaborators

1 joint publications

Muhammad Zubair Khan

1 joint publications

Mohsin Saleem

1 joint publications

Zahid Ullah

1 joint publications

Noureddine Elboughdiri

1 joint publications

Shahid Iqbal

Frequent Collaborators

1 joint publications

Muhammad Zubair Khan

1 joint publications

Mohsin Saleem

1 joint publications

Zahid Ullah

1 joint publications

Noureddine Elboughdiri

Top Related Videos

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

Published on : Apr 08, 2018

See more related videos

Top Related Videos

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

Published on : Apr 08, 2018

See more related videos