Changan Wang

1PUBLICATIONS
3CO-AUTHORS
Elemental semiconductors
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Publications (1)

|Jul 24, 2018
Defect-Induced Exchange Bias in a Single SrRuO3 Layer.

Changan Wang, Chao Chen, Ching-Hao Chang

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Frequent Collaborators

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Ching-Hao Chang

1 joint publications

Yu-Jia Zeng

1 joint publications

Xingsen Gao