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Changan Wang

1PUBLICATIONS

3CO-AUTHORS

Elemental semiconductors

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Publications (1)

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|Jul 24, 2018

Defect-Induced Exchange Bias in a Single SrRuO<sub>3</sub> Layer.

Changan Wang, Chao Chen, Ching-Hao Chang

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Frequent Collaborators

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Ching-Hao Chang

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Yu-Jia Zeng

1 joint publications

Xingsen Gao

Frequent Collaborators

1 joint publications

Ching-Hao Chang

1 joint publications

Yu-Jia Zeng

1 joint publications

Xingsen Gao

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