Marek Schmidt
4PUBLICATIONS
2CO-AUTHORS
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Publications (4)
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|Apr 11, 2020
Conductance Tunable Suspended Graphene Nanomesh by Helium Ion Beam Milling.Fayong Liu, Zhongwang Wang, Soya Nakanao
|Oct 02, 2019
Dielectric-Screening Reduction-Induced Large Transport Gap in Suspended Sub-10 nm Graphene Nanoribbon Functional Devices.Marek E Schmidt, Manoharan Muruganathan, Teruhisa Kanzaki
|Feb 28, 2018
Structurally Controlled Large-Area 10 nm Pitch Graphene Nanomesh by Focused Helium Ion Beam Milling.Marek Edward Schmidt, Takuya Iwasaki, Manoharan Muruganathan
|May 11, 2017
Nitrogen Gas Field Ion Source (GFIS) Focused Ion Beam (FIB) Secondary Electron Imaging: A First Look.Marek E Schmidt, Anto Yasaka, Masashi Akabori
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