Josef Simbrunner
5PUBLICATIONS
14CO-AUTHORS
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Publications (5)
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|Aug 06, 2025
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction.Fabian Gasser, Sanjay John, Jorid Smets
|Feb 07, 2025
Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors.Fabian Gasser, Josef Simbrunner, Marten Huck
|Jul 01, 2022
Impact of sample misalignment on grazing incidence x-ray diffraction patterns and the resulting unit cell determination.Valentin Holzer, Benedikt Schrode, Josef Simbrunner
|May 03, 2022
Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. II. Experimental results.Josef Simbrunner, Jari Domke, Falko Sojka
|May 03, 2022
Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. I. Theory.Josef Simbrunner, Jari Domke, Roman Forker
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Frequent Collaborators
5 joint publications
Roland Resel
2 joint publications
Jari Domke
2 joint publications
Roman Forker
2 joint publications
Torsten Fritz
2 joint publications
Fabian Gasser
1 joint publications
Falko Sojka
1 joint publications
Andreas Jeindl
1 joint publications
Felix Otto
1 joint publications
Marco Gruenewald
1 joint publications
Benedikt Schrode
