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Josef Simbrunner

5PUBLICATIONS

14CO-AUTHORS

CeramicsPhotogrammetry and remote sensingCrystallographyTheory and design of materials

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Publications (5)

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|Aug 06, 2025

A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction.

Fabian Gasser, Sanjay John, Jorid Smets

|Feb 07, 2025

Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors.

Fabian Gasser, Josef Simbrunner, Marten Huck

|Jul 01, 2022

Impact of sample misalignment on grazing incidence x-ray diffraction patterns and the resulting unit cell determination.

Valentin Holzer, Benedikt Schrode, Josef Simbrunner

|May 03, 2022

Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. II. Experimental results.

Josef Simbrunner, Jari Domke, Falko Sojka

|May 03, 2022

Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. I. Theory.

Josef Simbrunner, Jari Domke, Roman Forker

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Frequent Collaborators

5 joint publications

Roland Resel

2 joint publications

Jari Domke

2 joint publications

Roman Forker

2 joint publications

Torsten Fritz

2 joint publications

Fabian Gasser

1 joint publications

Falko Sojka

1 joint publications

Andreas Jeindl

1 joint publications

Felix Otto

1 joint publications

Marco Gruenewald

1 joint publications

Benedikt Schrode

Frequent Collaborators

5 joint publications

Roland Resel

2 joint publications

Jari Domke

2 joint publications

Roman Forker

2 joint publications

Torsten Fritz

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