Saeid Pourbabak

1PUBLICATIONS
2CO-AUTHORS
Electrical circuits and systems
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

|Sep 11, 2020
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires.

Saeid Pourbabak, Andrey Orekhov, Dominique Schryvers

Pageof 1