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T Moschos, C Pappas, S Kovaios+9
C Pappas
S Kovaios
A Prapas
A Tsakyridis
M Moralis-Pegios
C Vagionas
Y London
B Tossoun
T Van Vaerenbergh
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on : Apr 01, 2020