Chaohui He
3PUBLICATIONS
3CO-AUTHORS
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Publications (3)
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|Jan 25, 2025
Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis.Hualiang Zhou, Hao Yu, Zhiyang Zou
|Nov 08, 2024
First-Principles Study on Strain-Induced Modulation of Electronic Properties in Indium Phosphide.Libin Yan, Zhongcun Chen, Yurong Bai
|Nov 08, 2024
Molecular Dynamic Simulation of Primary Damage with Electronic Stopping in Indium Phosphide.Yurong Bai, Wenlong Liao, Zhongcun Chen
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