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Elena Segura-Sanchis, Ana Moreno, Fernando Ramiro-Manzano+3
Elena Segura-Sanchis
Ana Moreno
Roberto Fenollosa
Marta Feliz
Pedro Atienzar
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on : Dec 05, 2015