Yusin Yang
2PUBLICATIONS
8CO-AUTHORS

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Publications (2)
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|Jun 19, 2025
Non-contact and nanometer-scale measurement of PN junction depth buried in Si wafers using terahertz emission spectroscopy.Fumikazu Murakami, Shinji Ueyama, Kenji Suzuki
|Feb 22, 2025
Near-field terahertz time-domain spectroscopy for in-line electrical metrology of semiconductor integration processes for memory.Sunhong Jun, Inkeun Baek, Suhwan Park
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