Get your video featured.
Md Fokhrul Islam, Yiing C Yap, Feng Li+2
Md Fokhrul Islam
Rosanne M Guijt
Michael C Breadmore
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015