Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Amritesh Sharma

1PUBLICATIONS

10CO-AUTHORS

Elemental semiconductors

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Oct 27, 2023

Role of a capping layer on the crystalline structure of Sn thin films grown at cryogenic temperatures on InSb substrates.

An-Hsi Chen, Connor Dempsey, Mihir Pendharkar

Pageof 1

Frequent Collaborators

1 joint publications

An-Hsi Chen

1 joint publications

Connor Dempsey

1 joint publications

Mihir Pendharkar

1 joint publications

Bomin Zhang

1 joint publications

Susheng Tan

1 joint publications

Ludovic Bellon

1 joint publications

Sergey M Frolov

1 joint publications

Christopher J Palmstrøm

1 joint publications

Edith Bellet-Amalric

1 joint publications

Moïra Hocevar

Frequent Collaborators

1 joint publications

An-Hsi Chen

1 joint publications

Connor Dempsey

1 joint publications

Mihir Pendharkar

1 joint publications

Bomin Zhang

Top Related Videos

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on : Jul 14, 2022

See more related videos

Top Related Videos

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on : Jul 14, 2022

See more related videos