Javier Diaz-Fortuny

1PUBLICATIONS
1CO-AUTHORS
Electronic device and system performance evaluation, testing and simulation
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Publications (1)

|Jun 27, 2024
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage.

Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Erik Bury

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Frequent Collaborators

1 joint publications

Pablo Saraza-Canflanca