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Hongfei Li, Yuzheng Guo, John Robertson
Hongfei Li, Yuzheng Guo, John Robertson
Zhenxu Lin, Hongfei Li, Rui Huang

Tuning Oxide Properties by Oxygen Vacancy Control During Growth and Annealing
Published on : Jun 09, 2023

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on : Jul 17, 2020

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on : May 28, 2016