Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Carl E Bonner

2PUBLICATIONS
3CO-AUTHORS
Translational and applied bioinformaticsNanofabrication, growth and self assembly
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

Sort by Publication Date:
|Jun 06, 2023
Advancing Research at the Nation's 101 HBCUs and Their Role in Maintaining the Nation's Competitiveness in Science and Technology.

Michael L Curry, Carl Bonner, Desmond Stubbs

|May 31, 2023
The Influence of Nonlocal Metal-Dielectric Environments on Physical and Chemical Processes.

Carl E Bonner, Mikhail Noginov, Vanessa N Peters

Pageof 1

Frequent Collaborators

1 joint publications

Michael L Curry

1 joint publications

Mikhail Noginov

1 joint publications

Thejaswi U Tumkur

Frequent Collaborators

1 joint publications

Michael L Curry

1 joint publications

Mikhail Noginov

1 joint publications

Thejaswi U Tumkur

Top Related Videos

Bridging the Technology Divide in the COVID-19 Era: Using Virtual Outreach to Expose Middle and High School Students to Imaging Technology
09:55

Bridging the Technology Divide in the COVID-19 Era: Using Virtual Outreach to Expose Middle and High School Students to Imaging Technology

Published on : Sep 28, 2022

1.7K
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on : Jun 26, 2015

8.8K
See more related videos

Top Related Videos

Bridging the Technology Divide in the COVID-19 Era: Using Virtual Outreach to Expose Middle and High School Students to Imaging Technology
09:55

Bridging the Technology Divide in the COVID-19 Era: Using Virtual Outreach to Expose Middle and High School Students to Imaging Technology

Published on : Sep 28, 2022

1.7K
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on : Jun 26, 2015

8.8K
See more related videos