Barry O'Sullivan

1PUBLICATIONS
4CO-AUTHORS
Electrical circuits and systems
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Publications (1)

|Aug 26, 2023
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.

Stanislav Tyaginov, Barry O'Sullivan, Adrian Chasin

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Frequent Collaborators

1 joint publications

Stanislav Tyaginov

1 joint publications

Yosuke Kimura

1 joint publications

Michiel Vandemaele

1 joint publications

Senthil Vadakupudhu Palayam