Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Simon Fischer

1PUBLICATIONS

4CO-AUTHORS

Forensic evaluation, inference and statistics

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Oct 26, 2022

Low-energy electron microscopy intensity-voltage data - Factorization, sparse sampling and classification.

Francesco Masia, Wolfgang Langbein, Simon Fischer

Pageof 1

Frequent Collaborators

1 joint publications

Francesco Masia

1 joint publications

Wolfgang Langbein

1 joint publications

Jon-Olaf Krisponeit

1 joint publications

Jens Falta

Frequent Collaborators

1 joint publications

Francesco Masia

1 joint publications

Wolfgang Langbein

1 joint publications

Jon-Olaf Krisponeit

1 joint publications

Jens Falta

Top Related Videos

An Unbiased Approach of Sampling TEM Sections in Neuroscience

An Unbiased Approach of Sampling TEM Sections in Neuroscience

Published on : Apr 13, 2019

See more related videos

Top Related Videos

An Unbiased Approach of Sampling TEM Sections in Neuroscience

An Unbiased Approach of Sampling TEM Sections in Neuroscience

Published on : Apr 13, 2019

See more related videos