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Y Nagashima, K Hanada, H Zushi
T Ido, M Hasegawa, R Ikezoe
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on : May 10, 2021
Building Langmuir Probes and Emissive Probes for Plasma Potential Measurements in Low Pressure, Low Temperature Plasmas
Published on : May 25, 2021
Preparing an Isotopically Pure <sup>229</sup>Th Ion Beam for Studies of <sup>229m</sup>Th
Published on : May 03, 2019
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on : May 10, 2021
Building Langmuir Probes and Emissive Probes for Plasma Potential Measurements in Low Pressure, Low Temperature Plasmas
Published on : May 25, 2021
Preparing an Isotopically Pure <sup>229</sup>Th Ion Beam for Studies of <sup>229m</sup>Th
Published on : May 03, 2019