Dencho Spassov
5PUBLICATIONS
11CO-AUTHORS
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Publications (5)
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|Dec 11, 2025
Electrically Active Defects and Traps and Their Relation to Stoichiometry and Chemical Environment in HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Dielectric Stacks as Revealed by XPS.Dencho Spassov, Albena Paskaleva, Ivalina Avramova
|Jan 25, 2025
Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors.Snežana Djorić-Veljković, Emilija Živanović, Vojkan Davidović
|Jul 27, 2024
Peculiarities of Electric and Dielectric Behavior of Ni- or Fe-Doped ZnO Thin Films Deposited by Atomic Layer Deposition.Albena Paskaleva, Dencho Spassov, Blagoy Blagoev
|Apr 27, 2024
A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress.Emilija Živanović, Sandra Veljković, Nikola Mitrović
|Sep 09, 2023
Challenges to Optimize Charge Trapping Non-Volatile Flash Memory Cells: A Case Study of HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Nanolaminated Stacks.Dencho Spassov, Albena Paskaleva
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Frequent Collaborators
5 joint publications
Albena Paskaleva
2 joint publications
Emilija Živanović
2 joint publications
Nikola Mitrović
2 joint publications
Snežana Djorić-Veljković
2 joint publications
Danijel Danković
1 joint publications
Igor Jovanović
1 joint publications
Blagoy Blagoev
1 joint publications
Sandra Veljković
1 joint publications
Goran Ristić
1 joint publications
Ivalina Avramova
