Giovanni Giorgino
1PUBLICATIONS
3CO-AUTHORS

Get your video featured.

Get your video featured.
Publications (1)
Sort by Publication Date:
|Aug 28, 2025
On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs.Giovanni Giorgino, Cristina Miccoli, Marcello Cioni
Pageof 1
